УДК 519.245; 519.674 © B.G. Kukharenko IDENTIFICATION OF ATOMIC LATTICE ORIENTATION IN NANOSCALE IMAGES OF NANOMATERIALS In this paper a method for identification of atomic lattice orientation and spacing in nanomaterial nanoscale images produced by the Transmission Electron Microscope is described. <...> The method is based on the Hough Transform of lines. <...> As example a local atomic lattice orientation and spacing of a nanomaterial with surface irregular lattice is under study. <...> Keywords: nanomaterials, lattice defects, lattice orientation, lattice spacing, Transmission Electron Microscopy, nanoscale images, Hough Transform. 1. <...> Materials reduced to the nanoscale demonstrate different properties as compared to what they exhibit at a macroscale. <...> As example, image of reconstruction on a clean Au(100) surface is visualized using TEM-microscopy. <...> So a goal of atomiclattice image processing is to detect a local linear structure, or more specifically, to find parallel lines, their relative orientations, and distances between parallel lines of identical direction. <...> At first, by knowing of a relative orientation of different materials, it can be learnmore about the crystallographic structure of nanomaterial interfaces. <...> Secondly, the knowledge of the orientation of surface layer and trace underlain layers, coupled with diffraction pattern and higher resolution images, cangivesignature of the nanomaterial, its structure and properties. <...> At last by learning the distances between parallel lines of atomic lattice image, the lattice spacing can be determined. <...> Example of the TEM image of the Au surface 2. <...> Themapping is achieved in a computationally efficient manner, based on a function that describes the target shape. <...> In a Cartesian parameterization, image collinear points with current co-ordinates (x, y) are related by their slope m and intercept c as y=mx+c. (1) Equation (1) can be written in homogeneous formas Ay+Bx+1+0, (2) where A = –1/c and B = m/c.Thus, an image line is defined by parameters (A, B). <...> The equation (2) is symmetric since each pair of co-ordinates (x, y) also defines a line in space (A, B). <...> Проблемы машиностроения и автоматизации, № 2 – 2012 (3) 75 ) of B.G. Kukharenko Systemof equations (3) can be rewritten in terms of the Cartesian parameterization as vv p 2 . (4) For parameter <...>