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Вестник Российского университета дружбы народов. Серия: Математика, информатика, физика  / №2 2013

Light-Diode Holoellipsometer with Binary Modulation of Polarization Employing Light Scattering from Uniaxial Bi-Dimension Crystal (80,00 руб.)

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Первый авторAli
АвторыKiryanov A.P., Kovalev V.I., Kvasha I.V.
Страниц9
ID404348
АннотацияA holoellipsometer with binary modulation of polarization employing almost normal light scattering by the sample representing itself an optically uniaxial crystal is presented. The device is actual for the tomometric tools which are widely used in nanotechnologies and medicine. The main equations of the holoellipsometry employing normal light scattering method are obtained.
УДК535.51; 621.382
Light-Diode Holoellipsometer with Binary Modulation of Polarization Employing Light Scattering from Uniaxial Bi-Dimension Crystal / M. Ali [и др.] // Вестник Российского университета дружбы народов. Серия: Математика, информатика, физика .— 2013 .— №2 .— С. 203-211 .— URL: https://rucont.ru/efd/404348 (дата обращения: 14.07.2024)

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UDC 535.51; 621.382 Light-Diode Holoellipsometer with Binary Modulation of Polarization Employing Light Scattering from Uniaxial Bi-Dimension Crystal M. Ali∗, A. P. Kiryanov†, V. I. Kovalev‡, I. V. Kvasha§ ∗ Bauman Moscow State Technical University 2-nd Baumanskaya str., 5, 105050, Moscow, Russia † Scientific and Technological Center for Unique Instrumentation of RAS Butlerova str., 15, 117312, Moscow, Russia ‡ Department of the Kotelnikov Institute of Electronics and Radiotechniques of RAS Fryazino of the Moscow region, Russia § Experimental Physics Department People‘s Friendship University of Russia Miklukho-Muklaya str., 6, 117198, Moscow, Russia A holoellipsometer with binary modulation of polarization employing almost normal light scattering by the sample representing itself an optically uniaxial crystal is presented. <...> The main equations of the holoellipsometry employing normal light scattering method are obtained. <...> Key words and phrases: ellipsometry, light scattering, polarization, uniaxial bi-dimensional crystals. 1. <...> Here, an ever-increasing role is gained by non-destructive optical diagnostics techniques of applied-physics parameters of semiconductor and dielectric materials, films, coatings and interfaces, being formed in multi-stage technological processes [4]. <...> Optical techniques – are first of all, ellipsometry techniques, such as direct, remote, tems, can be efficiently implemented by way of polarization registration of scattered light [6] from optically uniaxial crystal systems under the use of holoellipsometry and its implementation techniques [7]. non-contact and non-destructive techniques, quite fitting to various technological lines and allowing their efficient automatization [5]. <...> Monitoring of anisotropic, in medias res nanometric layers, actual for surface sysholoellipsometer with binary modulation of light polarization employing almost normal light scattering by an uniaxial bi-dimensional crystal 2. <...> Optical diagram and operation of light diode tering by uniaxial bi-dimensional crystal sample with the use of light flux binary modulation is given in Fig. 1. <...> Here LD — light diode; BSi — beam splitter; Pho – photodetector at input; BMP — binary modulator of polarization [8]; M1,2 — plane mirrors in the incident to sample S and reflected from it light fluxes; ACh — reflected flow absorption chamber; C — collimator; Cp — compensator <...>